Statistical Analysis of Profile Monitoring

Auteur: Noorossana, Rassoul
Editeur: John Wiley & Sons Inc
* This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials.
Sur commande
* This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials.
ISBN / EAN 9780470903223
Auteur Noorossana, Rassoul
Editeur John Wiley & Sons Inc