Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Auteur: Ibe, Eishi H.
Editeur: John Wiley & Sons Inc
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
Sur commande
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
ISBN / EAN 9781118479292
Auteur Ibe, Eishi H.
Editeur John Wiley & Sons Inc